JPH0482852U - - Google Patents
Info
- Publication number
- JPH0482852U JPH0482852U JP12524190U JP12524190U JPH0482852U JP H0482852 U JPH0482852 U JP H0482852U JP 12524190 U JP12524190 U JP 12524190U JP 12524190 U JP12524190 U JP 12524190U JP H0482852 U JPH0482852 U JP H0482852U
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- sample holder
- storage section
- silicon wafer
- reference surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Details Of Measuring And Other Instruments (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12524190U JPH0482852U (en]) | 1990-11-29 | 1990-11-29 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12524190U JPH0482852U (en]) | 1990-11-29 | 1990-11-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0482852U true JPH0482852U (en]) | 1992-07-20 |
Family
ID=31872849
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12524190U Pending JPH0482852U (en]) | 1990-11-29 | 1990-11-29 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0482852U (en]) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009272464A (ja) * | 2008-05-08 | 2009-11-19 | Techno Fine:Kk | サンプル保持機構 |
WO2011117953A1 (ja) * | 2010-03-24 | 2011-09-29 | 株式会社島津製作所 | 測定システム |
JP2020080357A (ja) * | 2018-11-12 | 2020-05-28 | 信越ポリマー株式会社 | 薄板収納容器 |
-
1990
- 1990-11-29 JP JP12524190U patent/JPH0482852U/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009272464A (ja) * | 2008-05-08 | 2009-11-19 | Techno Fine:Kk | サンプル保持機構 |
WO2011117953A1 (ja) * | 2010-03-24 | 2011-09-29 | 株式会社島津製作所 | 測定システム |
JP5298237B2 (ja) * | 2010-03-24 | 2013-09-25 | 株式会社島津製作所 | 測定システム |
JP2020080357A (ja) * | 2018-11-12 | 2020-05-28 | 信越ポリマー株式会社 | 薄板収納容器 |